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量測SEMI/PCB - 精準檢測，品質管控
SEMI/PCB Measurement - Precision Inspection, Quality Control
cyber非接觸式掃描儀
2D非接觸式掃描系統
專為晶圓測量所特別設計的測量系統
ScanCT – the metrology software for manual measurements and analysis. Easy use, yet powerful to get high-accurate results. Define your measurement, select the areas of interest in the scan, and choose from over 500 individual analyses to gain comprehensive insights into your samples.
Measurement of transparent films or deposits such as flux or epoxy.
Flatness measurement is required for a variety of components including wafers, optical and mechanical parts.
Flatness measurement is required for a variety of components including wafers, optical and mechanical parts.
Measure absolute thickness, thickness variation (TTV), bow and warp.
Non-destructive and fast surface roughness measurement according to international standards.
Controlling the thickness of electronic devices or measuring film thickness is essential.
Dual Non-Contact Measurement System For Large Parts
雷射非接觸式量測，乾濕產品皆可量測
精確快速2D/3D非接觸式掃描系統