Vantage 1

Cyber Non-contact Profilometer

雷科股份有限公司

SEMI/PCB Measurement - Precision Inspection, Quality Control

SEMI/PCB Measurement - Precision Inspection, Quality Control
  • Non-contact Profilometer
    Non-contact Prof..
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    Cyber Applicatio..
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    Optical Barcode ..
  • Thermo-tracker/SMD/BGA/Dry Furnace PTF/Firing Furnace
    Thermo-tracker/S..

Vantage 1

Cyber Non-contact Profilometer

Vantage 1
Vantage 1

  • 2D non-contact profiling system.
  • Laser non-contact measurement applicable to both dry and wet films.
  • 0.125um dynamic high resolution, measurement precision up to 1um.
  • [Measuring]2D (y,z or x,z), Height, Height (Avg), Length, Angle, Angle (Planar), Center, Roughness, Radius (Avg, Max, RMS, Rz).
  • Finely tunable final product holder.
  • 【Application】 Thickness measurement of thick film printing, hybrid circuits, BGA, TAB and FLIP/CHIP, and Solder Bumping; SMT solder paste measurement; 2D size and angle measurement.

Product Description

Other Product Description

Vantage 1 Vantage 1
Depth of laser scribing Depth of laser scribing
3D metallization measurement on solar cells 3D metallization measurement on solar cells
Thick-film height on hybrid circuits Thick-film height on hybrid circuits
Roughness of a Gold Layer Roughness of a Gold Layer
Printed Feature on a LTCC Tape Printed Feature on a LTCC Tape
Cyber Technologies Vantage Cyber Technologies Vantage
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