量測SEMI/PCB - 精準檢測，品質管控

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Controlling the thickness of electronic devices or measuring film thickness is essential.

Non-destructive and fast surface roughness measurement according to international standards.

Measure absolute thickness, thickness variation (TTV), bow and warp.

Flatness measurement is required for a variety of components including wafers, optical and mechanical parts.

Flatness measurement is required for a variety of components including wafers, optical and mechanical parts.

Measurement of transparent films or deposits such as flux or epoxy.