cyber應用 -

雷科股份有限公司

量測SEMI/PCB - 精準檢測,品質管控

SEMI/PCB Measurement - Precision Inspection, Quality Control
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cyber應用

THICKNESS & THICKFILM

Controlling the thickness of electronic devices or measuring film thickness is essential.

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SURFACE ROUGHNESS

Non-destructive and fast surface roughness measurement according to international standards.

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TOTAL THICKNESS VARIATION (TTV)

Measure absolute thickness, thickness variation (TTV), bow and warp.

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FLATNESS MEASUREMENT

Flatness measurement is required for a variety of components including wafers, optical and mechanical parts.

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COPLANARITY MEASUREMENT

Flatness measurement is required for a variety of components including wafers, optical and mechanical parts.

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TRANSPARENT FILMS AND COATINGS

Measurement of transparent films or deposits such as flux or epoxy.

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