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SEMI/PCB Measurement - Precision Inspection, Quality Control
SEMI/PCB Measurement - Precision Inspection, Quality Control
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Cyber Non-contact Profilometer
Non-destructive and fast surface roughness measurement according to international standards.
TOTAL THICKNESS VARIATION (TTV)
Measure absolute thickness, thickness variation (TTV), bow and warp.
Flatness measurement is required for a variety of components including wafers, optical and mechanical parts.
Flatness measurement is required for a variety of components including wafers, optical and mechanical parts.
ScanCT – the metrology software for manual measurements and analysis. Easy use, yet powerful to get high-accurate results. Define your measurement, select the areas of interest in the scan, and choose from over 500 individual analyses to gain comprehensive insights into your samples.
