量測SEMI/PCB -

雷科股份有限公司

量測SEMI/PCB - 精準檢測,品質管控

SEMI/PCB Measurement - Precision Inspection, Quality Control
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量測SEMI/PCB

Vantage 1

Vantage 1

2D非接觸式掃描系統

BGA N2

BGA N2

SMT/BGA N2 REFLOW FURNACE

Scan CT

Scan CT

ScanCT – the metrology software for manual measurements and analysis. Easy use, yet powerful to get high-accurate results. Define your measurement, select the areas of interest in the scan, and choose from over 500 individual analyses to gain comprehensive insights into your samples.

Measurement of transparent films or deposits such as flux or epoxy.

Flatness measurement is required for a variety of components including wafers, optical and mechanical parts.

Flatness measurement is required for a variety of components including wafers, optical and mechanical parts.

Measure absolute thickness, thickness variation (TTV), bow and warp.

Non-destructive and fast surface roughness measurement according to international standards.

Controlling the thickness of electronic devices or measuring film thickness is essential.

N2 Fiiriing Furnace

PLOYMER THICKFILM CURING FURANCE

智慧型多重迴路式 PID溫控器,熱補償迅速,效率高

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