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SEMI/PCB Measurement - Precision Inspection, Quality Control
SEMI/PCB Measurement - Precision Inspection, Quality Control
Cyber Non-contact Profilometer
2D non-contact profiling system
專為晶圓測量所特別設計的測量系統
ScanCT – the metrology software for manual measurements and analysis. Easy use, yet powerful to get high-accurate results. Define your measurement, select the areas of interest in the scan, and choose from over 500 individual analyses to gain comprehensive insights into your samples.
Flatness measurement is required for a variety of components including wafers, optical and mechanical parts.
Flatness measurement is required for a variety of components including wafers, optical and mechanical parts.
Measure absolute thickness, thickness variation (TTV), bow and warp.
Non-destructive and fast surface roughness measurement according to international standards.
Controlling the thickness of electronic devices or measuring film thickness is essential.
Dual Non-Contact Measurement System for large parts
Laser non-contact measurement applicable to both dry and wet products
Precise and fast 2D/3D non-contact profiling system