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SEMI/PCB Measurement - Precision Inspection, Quality Control
SEMI/PCB Measurement - Precision Inspection, Quality Control
CT 600ST
Cyber Non-contact Profilometer
CT 600ST
- Dual Non-Contact Measurement System For Large Parts.
- 3d mapping of thickness,bow, warpage and rouhgness。
- User friendly concept。
- Sophisticated analysis and automation software。
- 【Applicable Range】 Typical applications for the CT 600ST are the analysis and quality control of large parts, such as large wafers, PCBs, substrates, glas and other optical components.<br> Thickness, geometry and position measurement of highly contoured objects like lenses, gaskets, turbine blades, as well as flatness and coplanarity analysis are other popular applications.
- 【Application】 Total thickness variation (TTV)、Flatness, warpage and bow、Printed products, systems or devices、Panel level packaging devices、Fuel cell elements、Medical devices.
Product Description
Other Product Description
CT 600ST
Dual Non-Contact Measurement System For Large Parts
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Wafer Thickness Map(TTV)t
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