詢問
表單
量測SEMI/PCB - 精準檢測，品質管控
SEMI/PCB Measurement - Precision Inspection, Quality Control
SURFACE ROUGHNESS
cyber非接觸式掃描儀
SURFACE ROUGHNESS
- Controlling the thickness of various print layers on hybrid substrates is essential because electrical parameters are directly related to the thickness. cyberTECHNOLOGIES high resolution non-contact 3D measurement systems are the ideal tool for thickfilm measurements.
- 【產品用途】 ct-100、ct-R200、ct-300
產品說明
詳細產品內容或加工說明
SURFACE ROUGHNESS
- Non-contact and fast surface roughness measurement according to international standards.
GLAS, MIRRORS, WAFERS(1)
- Head-up display automotive
- WLI is ideal for smooth and super smooth surfaces
- Wafers, mirrors, glass etc.
GLAS, MIRRORS, WAFERS(2)
- Glas surface with scratch
- Resolution in z down to 0.1 nm
- Lateral resolution in down to 0.23 µm
SURFACE DEFECT DETECTION(1)
- Surface on a copper surface defect
- Find defects or particels automatically
- Measures height, position and size of defects
- User independent and accurate defect qualification
SURFACE DEFECT DETECTION(2)
- Contour of a copper surface defect
- Automatic detection of defects using 3D edge finding
- Surface waviness compensation algorithms
ELECTRICAL CONTACT SURFACE(1)
- Gold surface
- 400 µm range, fast scanning speed
- systems equipped with the confocal microscope (CFM) are well suited for rough and highly contoured surfaces
ELECTRICAL CONTACT SURFACE(2)
- Roughness of an electrical contact surface
- CFM Scan with 100X magnification, 0,23 µm lateral and 1 nm height resolution
- 2D and 3D roughness, material ratio