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SEMI/PCB Measurement - Precision Inspection, Quality Control
SEMI/PCB Measurement - Precision Inspection, Quality Control
SCAN CT
Cyber Non-contact Profilometer
Product Description
Other Product Description
2D PROFILE MEASUREMENT(1)
- Step Height (avg., max. and min. height)
- Flatness and Warpage
- Width and Length
- Cross Section Area
- Angle, Radius, Contour Analysis
2D PROFILE MEASUREMENT(2)
- Define base line and measurement areas using reference and measurement cursors. Select analysis from dropdown menu.
3D COPLANARITY MEASUREMENT(1)
- 3D Height (avg., max. and min. height)
- Flatness and Warpage
- Coplanarity
3D COPLANARITY MEASUREMENT(2)
- Draw rectangle, round or polygon cursors to define base plane and measurement areas.
3D ROUGHNESS MEASUREMENTS(1)
- New DIN EN ISO 25178 Parameters
- 3D Waviness Filters
- 3D Abbott-Firestone material curve, Histogram
3D ROUGHNESS MEASUREMENTS(2)
- Use advanced DIN /TS 16610 Filters. 3D Roughness Analysis even on warped or uneven surfaces.
PARALLEL DATA COLLECTION(1)
- Parallel scanning with up to 4 sensors
- Collect Top, Bottom and Thickness data
- Average Thickness, Bow and Curvature
- Total Thickness Variation
- Parallel Intensity Masking
PARALLEL DATA COLLECTION(2)
- Graphical display of thickness maps and top/bottom surfaces.
PROFILE ROUGHNESS MEASUREMENTS(1)
- DIN EN ISO conform Roughness Parameters
- Shape Removal Algorithm
- Abbott-Firestone Material Curve
- Histogram
- Tip Simulation for Non-Contact Systems
PROFILE ROUGHNESS MEASUREMENTS(2)
- Advanced roughness analysis, even on round or angled surfaces using shape compensation. Display waviness and roughness profile.
3D VOLUME & AREA MEASUREMENTS(1)
- Volume (Cuts, Fills, Net Volume)
- Planar area
- Surface area
3D VOLUME & AREA MEASUREMENTS(2)
- Measures cuts and fills and uses height threshold. Accurate areal and planar surface calculations.
2D/3D SURFACE COMPENSATION(1)
- 2D and 3D Polynom Fit
- Pre- and after measurements
- Areal Waviness Compensation
2D/3D SURFACE COMPENSATION(2)
- Surface compensation is only applied based on the data in the reference cursors.
MORE FEATURES AND HIGHLIGHTS(1)
- x-, y-, z-data stitching capability
- 2D and 3D etch detection algorithm
- 3D surface matching
- Raster up to 400,000,000 data points
- Integrated user management
MORE FEATURES AND HIGHLIGHTS(2)
- Compare geometry by overlaying profiles.